Agilent Technologies ENA Series Betriebsanweisung Seite 334

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328 Chapter 8
Frequency-Offset Measurement (Option 008)
Measurement of Harmonic Distortion
Measurement of Harmonic Distortion
Using the frequency-offset function and absolute measurement function in combination
allows you to measure harmonic distortion of nonlinear devices such as mixers and
amplifiers.
Measurement flow
Table 8-4 shows the measurement flow.
1. Setting Frequency-Offset Function
The frequency-offset function allows you to make measurements while the frequencies are
different at each test port. In this case, measurement is done by using the setting example
for measurement frequency in Figure 8-12. For the setting of frequency-offset sweep, see
"1. Setting Frequency-Offset" on page 315.
Table 8-4 Measurement Flow of Harmonic Distortion
Item Description
"1. Setting
Frequency-Offset" on page
315
Sets frequency-offset function
"2. Implementing Receiver
Calibration" on page 329
Implements receiver calibration
"3. Setting Absolute
Measurement Parameters"
on page 329
Sets absolute measurement parameters
Procedures for setting absolute measurement parameters
"4. Harmonic Distortion
Measurement" on page 330
Implements harmonic distortion measurement
Connection of DUT
Procedures for setting measurement parameters
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