Agilent Technologies B1500A Betriebsanweisung Seite 120

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2- 72 Agilent B1500 User’s Guide, Edition 7
Introduction
Specifications
Agilent Desktop EasyEXPERT Software
Desktop EasyEXPERT is the same software that is built-in to the PC-based Agilent
B1500A Semiconductor Device Analyzer, except that it runs on a standalone PC.
Just like standard EasyEXPERT, Desktop EasyEXPERT supports all aspects of
parametric test, from basic manual measurements to test automation across a wafer
in conjunction with a semi-automatic wafer prober.
Features and benefits
Large application test library
Desktop EasyEXPERT comes with over 200 application tests conveniently
organized by
device type, application, and technology. Many of these
application tests will run on the 4155/4156 without modification, and you can
easily edit and customize the furnished application tests to fit your specific
needs.
Offline capability
Desktop EasyEXPERT can be run in either online or of
fline mode. In the offline
mode you can perform tasks such as analyzing data and creating new application
tests. This frees up your existing analyzer from being needed for development
work and enables you to use it for its primary purpose: making measurements.
GUI-based classic test mode
Desktop EasyEXPERT offers a classic test mode th
at maintains the look, feel,
and terminology of the 4155/4156 user interface. In addition, it improves the
4155/4156 user interface by taking full advantage of Microsoft Windows GUI
features.
Easy test sequencing
A GUI-based Quick Test mode enables you to perform test sequencing without
programming. Yo
u can select, copy, rearrange and cut-and-paste any application
tests with a few simple mouse clicks. Once you have selected and arranged your
tests, simply click on the measurement button to begin running an automated test
sequence.
Prober control
All popular semi-automatic wafer probers are supported by Desktop
EasyEXPER
T. You can define wafer, die, and module information for probing
across an entire wafer. You can also combine wafer prober control with either
Quick Test mode or an application test based test sequence to perform multiple
testing on various devices across the wafer.
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