Agilent Technologies E6640A EXM Wartungshandbuch PDF herunterladen (Seite 255)

Chapter 17 255

LTE-FDD Programming Commands

Adjacent Channel Power (ACP)

LTE-FDD Programming Commands

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST[:FREQuency]

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:STATe

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:BANDwidth

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:BANDwidth:RESolution

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:BANDwidth:RESolution:AUTO

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:BANDwidth:SHAPe

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:BANDwidth:TYPE

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:ABSolute

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:TEST

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:RCARrier

[:SENSe]:LSEQuencer:LTE:ACPower:OFFSet[1]|2:LIST:RPSDensity

ACP results

Index Result Parameter

0 Overall Pass/Fail result - returns 24 scalar values of the pass/fail (0.0 = pass, 1.0

= fail) determined by testing the relative to the reference carrier and by testing

the absolute power limit of the offset frequencies (measured as total power in

dBm)

1. Lower Offset A - relative limit test result

2. Lower Offset A - absolute limit test result

3. Upper Offset A - relative limit test result

4. Upper Offset A - absolute limit test result

5. Lower Offset B - relative limit test result

6. Lower Offset B - absolute limit test result

7. Upper Offset B - relative limit test result

8. Upper Offset B - absolute limit test result

...

21. Lower Offset F - relative limit test result

22. Lower Offset F - absolute limit test result

23. Upper Offset F - relative limit test result

24. Upper Offset F - absolute limit test result

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Agilent Technologies E6640A EXM Wartungshandbuch Seite 255