Agilent 4155C SemiconductorParameter AnalyzerAgilent 4156C Precision SemiconductorParameter AnalyzerTechnical DataIntroductionSMU: Source Monitor Unit
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2Hardware3. Ambient temperature change less than ± 1°C after auto calibration execution.4. Integration time: medium or long5. Filter: O
3For example, accuracy specifications aregiven as ±% of set/measured value (0.02%)plus offset value (1mV+13µV×Vi) for the 2Vrange. The differential m
4Agilent 41501B SMU and Pulse Generator ExpanderOutput terminal/connection:Dual triaxial connectors, Kelvin (remotesensing)Voltage/Current Compliance(
Pulse Range and Pulse Parameter (PGU)10ms0 - 10s0.01s - 9.99s1s - 10s61ms0 - 1000ms1ms - 999ms100ms - 1000ms5100µs0 - 100ms0.1ms - 99.9ms10ms -100ms41
6 VAR2Subordinate linear staircase or linearpulsed sweep. After primary sweep iscompleted, the VAR2 unit output isincremented.Maximum
7Text Hard CopyPrint out setup information or measureddata list as ASCII text via GPIB,parallel printer port, or networkinterface to supported HP plot
8GPIB programGPIB programs for the 4145B canbe used when the 4145B commandset is selected.Note: There is a possibility that GPIBprograms for the 4145B
9Accessory Specifications16442A Test FixtureChannel InformationSMU: 6 channels (1 triaxial connector/ channel) 3 channels (1 Kelvin triaxial co
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