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Applications:

Optical Receiver Stress Test

Reference transmitter conditioning setup

This setup varies depending on the speed class and number of lanes. For

single lane setups it is just an E/O converter and an optical attenuator.

For multi-lane applications it gets more complicated.

WDM conformance testing 40 Gbase, 100 Gbase -LR4, -ER4

Signal characterization measurement

Test signal calibration and verification

Tunable E/O converter for selecting stressed lane under test:

Modulated with stressed test signal.

OMA set to „stressed receiver sensitivity spec“.

1) Wavelength (l) tuned to corresponding worst-case sensitivity of RXuT

2) Or fixed wavelength (l) in specified range of RxuT

Modulated test sources for other lanes:

Modulated simultaneously with valid standard pattern.

3) OMA set to highest „difference in receive power spec“.

Wavelength (l) tuned to corresponding worst-case crosstalk to lane

under test.

4) OMA set to highest „difference in receive power spec“ plus

increment of loss variation of lane under test, plus increment of

isolation variation to lane under test. Fixed wavelength (l) in

specified range of RXuT

Reference receiver:

Optical to electrical converter with 4th Order Bessel Thomson response

and reference frequency ft of:

ƒt = 7.5 GHz for 8 GFC

ƒt = 11.0 GHz for 16 GFC

ƒt = 7.5 GHz for 40 Gbase-LR4

Oscilloscope:

Use clean, un-jittered clock to verify stressed signal.

Optical receiver devices, especially those for data rates in the higher

Gbps-range, are commonly exposed to extensive stressed receiver

sensitivity tests during their design and qualification phase to verify their

performance and to determine their margin against the requirements. The

BER is measured under standard compliant stressed conditions at various

optical modulation amplitudes (OMA) to BER down to 10

-12

or lower. In

the manufacturing phase, BER tests are performed at a few different OMA

points down to only BER of 10

-9

to reduce test time and cost. Applying

this reduced test scheme in series implies that the device manufacturer

knows very well the device margins. This leads to the requirements for a

test solution with high accuracy and reproducibility regarding the stressed

test signal generation. For the optical part of the stressed signal genera-

tion, this means maintaining high signal fidelity. This demand may lead

especially for multimode fiber devices to some interesting test challenges.

This catalog covers the test equipment needed to perform these tests. Get

more detail about Agilent’s N4917A Optical Receiver Stress Test Solution

on page 30.

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