Agilent Technologies Option H48 Multiport Test Set Z5623A Spezifikationen

安捷倫科技高頻元件量測研討會時間: 2006年 2月23日地點: 高雄金典酒店

9安捷倫科技高頻元件量測研討會2/23/2006Page 17Chip capacitanceOpen waveformbare substrate2202 T4failuregood unit 2good unit 1Analysis Case III ÆFA Application▼▼TDR o

8Page 15安捷倫科技高頻元件量測研討會Feb.23, 2006Simulated Eye Diagram of Measured ConnectorDifferential, true/compliment skew +/- 50 ps• Eye opening on left-side is

9Page 17安捷倫科技高頻元件量測研討會Feb.23, 2006PackageCardCardDiePackageDieDriverReceiverADS for Signal Integrity – Link Level SimulationSimulators• Frequency-doma

10Page 19安捷倫科技高頻元件量測研討會Feb.23, 2006Agilent Ptolemy• Agilent Ptolemy is the Data Flow simulator • System Level Simulation Kernel • based on UC Berkeley

11Page 21安捷倫科技高頻元件量測研討會Feb.23, 2006Agilent Ptolemy - The “IP Integrator”ADS Ptolemy is a solution for the following:• Design & verification of Co

12Page 23安捷倫科技高頻元件量測研討會Feb.23, 2006Transmitter with Pre-EmphasisPage 24安捷倫科技高頻元件量測研討會Feb.23, 2006Channel ModelAggressor LinesChannel Subnetwork

13Page 25安捷倫科技高頻元件量測研討會Feb.23, 2006Channel SubnetworkPage 26安捷倫科技高頻元件量測研討會Feb.23, 2006ModelsAccurate models of interconnectsAccurate models of the act

14Page 27安捷倫科技高頻元件量測研討會Feb.23, 2006Interconnect ModelsAccount for impedance, delay, conductor loss, dielectric loss, and couplingMomentum EM simulator

15Page 29安捷倫科技高頻元件量測研討會Feb.23, 2006• near field / low freq approximationL(ω) = L0+ L1ωR + L2(ωR)2+ …C(ω) = C0+ C1ωR + C2(ωR)2+ …• neglecting far field

16Page 31安捷倫科技高頻元件量測研討會Feb.23, 2006Models in Matlab, VHDL, C++, SystemC, Verilog-AIP for “Link Level” blocks and functions often already exist, e.g.

17Page 33安捷倫科技高頻元件量測研討會Feb.23, 2006Models - HDL Co-Simulation in ADS PtolemyIn the HDL Blocks libraryVxlCosimV1HdlSimulatorGUI=OffHdlModelName="&

10安捷倫科技高頻元件量測研討會2/23/2006Page 19Analysis Case V : PDS Analysis -- Measurement setupTop view Bottom view27mm27mm安捷倫科技高頻元件量測研討會2/23/2006Page 20Analysis

18Page 35安捷倫科技高頻元件量測研討會Feb.23, 2006Measurement-based Models Probing Solution + PLTS + ADSADS Design SWS-parameters• Citifile• TouchstoneRLCG• Measured

19Page 37安捷倫科技高頻元件量測研討會Feb.23, 2006Bringing it All Together•ADS has been used for SI design for over 10 years•ADS can act as a scalable design whitebo

20Page 39安捷倫科技高頻元件量測研討會Feb.23, 2006SI Resources on the Agilent EEsof websiteAgilent EEsof EDA home pagehttp://eesof.tm.agilent.comSignal Integrity App

21Page 41安捷倫科技高頻元件量測研討會Feb.23, 2006Signal Integrity Training Classhttp://www.agilent.com/find/educationSignal Integrity Class: N3215A Designing for Si

22安捷倫科技高頻元件量測研討會Feb.23, 2006Page 43Using ADS for Signal Integrity DesignApplication Guides for SIPage 44安捷倫科技高頻元件量測研討會Feb.23, 2006AmplifierDesignGuide

23Page 45安捷倫科技高頻元件量測研討會Feb.23, 2006DesignGuides / Application GuidesIBIS model import and examplesSignal integrity simulations and examplesHighspeed c

24Page 47安捷倫科技高頻元件量測研討會Feb.23, 2006Wireline ApplicationsMultiplexerBuffer, DividerLatch, SelectorPage 48安捷倫科技高頻元件量測研討會Feb.23, 2006Wireline Application

25Page 49安捷倫科技高頻元件量測研討會Feb.23, 2006IBIS LibraryIBIS Model ImportPage 50安捷倫科技高頻元件量測研討會Feb.23, 2006Ideal Source BuffersOctal Pulse SourceOctal LoadsOsci

26Page 51安捷倫科技高頻元件量測研討會Feb.23, 2006Signal Integrity ApplicationsEye Diagram measurements including jitter, FrontPanel and DCA file importSingle Ended

27Page 53安捷倫科技高頻元件量測研討會Feb.23, 2006TDR Responses Using Time-domain SimulationPage 54安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Nonlinear Test Component

11安捷倫科技高頻元件量測研討會2/23/2006Page 210 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5Frequency (GHz)-55-50-45-40-35-30-25-20-15-10-5S21 (dB)Bare PCBpackage onlyBGA and PCBE

28安捷倫科技高頻元件量測研討會Feb.23, 2006Page 55Using ADS for Signal Integrity DesignEye DiagramPage 56安捷倫科技高頻元件量測研討會Feb.23, 2006Qualitative vs. Quantitative: How

29Page 57安捷倫科技高頻元件量測研討會Feb.23, 2006Data Display strengths and weaknessesData Displays are flexible but require extensive use of equations and a lot of

30Page 59安捷倫科技高頻元件量測研討會Feb.23, 2006Inspired by Agilent DCA-J InstrumentOscilloscope and Eye Modes of operationMeasurements/TestsSummary of measurement

31Page 61安捷倫科技高頻元件量測研討會Feb.23, 2006Eye/Mask ModePage 62安捷倫科技高頻元件量測研討會Feb.23, 2006Convert DCA data (*.csv format) into DatasetData Parser available in

32Page 63安捷倫科技高頻元件量測研討會Feb.23, 2006Compare Eye FP to DCA on Same DataDCA Measurement1G Data Rate through 20” trace Eye Diagram FrontPanel on the DCA o

33安捷倫科技高頻元件量測研討會Feb.23, 2006Page 65Using ADS for Signal Integrity DesignExample MeasurementsPage 66安捷倫科技高頻元件量測研討會Feb.23, 2006Common SI ProblemObjectiv

34Page 67安捷倫科技高頻元件量測研討會Feb.23, 2006Example Test BoardSeveral trace lengths on “improved FR-4” six metal layers, 62.5 mil total thickness10” (254mm) 15

35Page 69安捷倫科技高頻元件量測研討會Feb.23, 2006Create Models from DataData-based ModelMeasure with 4-port NWALayout Look-alike componentPage 70安捷倫科技高頻元件量測研討會Feb.2

36Page 71安捷倫科技高頻元件量測研討會Feb.23, 2006Simulation through Measured S-Parameter DataSimulationSimulation of measurement-based waveform through measured S-P

37Page 73安捷倫科技高頻元件量測研討會Feb.23, 2006Simulation compared to DCA Measurement2.5G Data Rate through 20” traceDCA Measurement of BERTSimulation with Measur

12安捷倫科技高頻元件量測研討會2/23/2006Page 23Design Rule/Specfor substrate layoutCharacterization Labcapability on Electrical,Thermal, Stress and MaterialComponent

38安捷倫科技高頻元件量測研討會Feb.23, 2006Page 75Using ADS for Signal Integrity DesignIBIS ModelPage 76安捷倫科技高頻元件量測研討會Feb.23, 2006IBIS (Input/Output Buffer Informati

39Page 77安捷倫科技高頻元件量測研討會Feb.23, 2006IBIS ModelA basic IBIS model consists ofFour I-V curves: pullup & Power clamp, pulldown and GndclampTwo ramps (

40Page 79安捷倫科技高頻元件量測研討會Feb.23, 20062.0E-82.2E-82.4E-82.6E-82.8E-83.0E-83.2E-83.4E-83.6E-83.8E-81.8E-84.0E-81.01.52.00.52.5timeAmplitudeRise/Fall TimeV

41Page 81安捷倫科技高頻元件量測研討會Feb.23, 2006Installation of design kitSelect the design kit from $HOME directoryInstall design kitPage 82安捷倫科技高頻元件量測研討會Feb.23,

42Page 83安捷倫科技高頻元件量測研討會Feb.23, 2006Simulation Setup and Simulation ResultsPin NumberV_fixturePage 84安捷倫科技高頻元件量測研討會Feb.23, 2006IBIS Model with Transist

43安捷倫科技高頻元件量測研討會Feb.23, 2006Page 85Using ADS for Signal Integrity DesignMomentumPage 86安捷倫科技高頻元件量測研討會Feb.23, 2006Momentum RF for Digital Board Interco

44Page 87安捷倫科技高頻元件量測研討會Feb.23, 2006Digital Board Interconnect - off resonance isolated traceport 1port 2harmonic signal 0.4 GHzoutputS(1,1)isolated

45Page 89安捷倫科技高頻元件量測研討會Feb.23, 2006Digital Board Interconnect harmonic signal 2.33 GHzharmonic signal is coupled to neighboring traces and spread arou

46Page 91安捷倫科技高頻元件量測研討會Feb.23, 2006Transient Simulation from SchematicLayout lookalike component used in the schematicPage 92安捷倫科技高頻元件量測研討會Feb.23, 200

1安捷倫科技高頻元件量測研討會Feb.23, 2006Page 1Advanced Calibration Techniques and FixturingIssues for VNAsAgilent Technologies Ltd.Ming-Fan, Tsai Application Engin

13安捷倫科技高頻元件量測研討會2/23/2006Page 25Plan and Actions for PKG DesignSubstrate Design Integrity Electrical Performance-Design Integrity Electrical performan

2Page 3安捷倫科技高頻元件量測研討會Feb.23, 2006Introduction - Goals and ObjectivesCourse Goal• Understand new calibration paradigm and features of PNA• Get hands-on

3Page 5安捷倫科技高頻元件量測研討會Feb.23, 2006What’s Totally New in 6.0…• Target release date: 12 December, 2005• Features– Calibrate using external trigger (e.g.,

4Page 7安捷倫科技高頻元件量測研討會Feb.23, 2006Will A.06.xx Work on Discontinued PNAs?“T1” RF PNA’s (E8356/7/8A): Yes, with upgrade to Windows XP“T2” 2-port (E8801/

5Page 9安捷倫科技高頻元件量測研討會Feb.23, 2006AgendaOverview of PNA FW Rev. 6.0 Cal RegistersTRL Calibration with 4-port 20 GHz PNA-LUnknown Thru CalibrationOffset

6Page 11安捷倫科技高頻元件量測研討會Feb.23, 2006New Calibration ParadigmCal Registers• Each channel has its own cal register• All cal data is saved to the channel c

7Page 13安捷倫科技高頻元件量測研討會Feb.23, 2006Old Calset File LocationAll calset data was contained in this filePage 14安捷倫科技高頻元件量測研討會Feb.23, 2006New Cal File Loca

8Page 15安捷倫科技高頻元件量測研討會Feb.23, 2006Saving Instrument States and Cal Data*.cst - save instrument state and reference pointer to the cal set data• data c

9Page 17安捷倫科技高頻元件量測研討會Feb.23, 2006Receiver calibrationReceiver calibration gives corrected absolute power reading (forunratioed traces as opposed to a

10Page 19安捷倫科技高頻元件量測研討會Feb.23, 2006AgendaOverview of PNA FW Rev. 6.0 Cal RegistersTRL Calibration with 4-port 20 GHz PNA-LUnknown Thru CalibrationOffs

11Page 21安捷倫科技高頻元件量測研討會Feb.23, 2006Assumptions for TRL (and Unknown Thru)8-term error model assume match at each test port remains constant, independe

14安捷倫科技高頻元件量測研討會2/23/2006Page 27THE ENDThank You For Your Listening

12Page 23安捷倫科技高頻元件量測研討會Feb.23, 2006Test port 1 Test port 2CDBATest port 3Test port 4RSingle Reference Receiver VNAs (like 4-Port PNA-L)Reference recei

13Page 25安捷倫科技高頻元件量測研討會Feb.23, 2006Delta Match CalDelta match cal characterizes internal match differences,so it can be performed…• with mixed connect

14Page 27安捷倫科技高頻元件量測研討會Feb.23, 2006Two Ways to Perform the Delta-Match CalibrationGlobal Delta Match• Covers entire frequency range of instrument• Int

15Page 29安捷倫科技高頻元件量測研討會Feb.23, 2006Performing the Global Delta Match Cal• Select DUT connectors (the only choice you have is in choosing the “DUT Port

16Page 31安捷倫科技高頻元件量測研討會Feb.23, 2006User Delta MatchInstead of selecting the Global Delta Match CalSet, select an available user CalSet that matches th

17Page 33安捷倫科技高頻元件量測研討會Feb.23, 2006Here, as a test case, we created a cal kit definition using “probe” as connector type. In this cal kit, we defined

18Page 35安捷倫科技高頻元件量測研討會Feb.23, 2006• Selecting “Mod Stds” brings up this screen • In this case, the default is TRL with Defined Thru• If you select

19Page 37安捷倫科技高頻元件量測研討會Feb.23, 2006• At this point, the calibration should start.• Based on the “probe” cal kit we created, we went through the follow

20Page 39安捷倫科技高頻元件量測研討會Feb.23, 2006Frequently Asked QuestionsCan I perform a 4-port TRL calibration?-- Yes, simply follow the same steps covered in th

21Page 41安捷倫科技高頻元件量測研討會Feb.23, 2006AgendaOverview of PNA FW Rev. 6.0 Cal RegistersTRL Calibration with 4-port 20 GHz PNA-LUnknown Thru CalibrationOffs

1安捷倫科技高頻元件量測研討會Feb.23, 2006Page 1PNA Based Solutions- Pulsed RF S-Parameter Measurements- Multiport Test Solutions- Physical Layer Test SystemsAgilent

22Page 43安捷倫科技高頻元件量測研討會Feb.23, 2006Compromises of Traditional MethodsSwap equal adapters• Need phase matched adapters of different sexes (e.g., f-f, m

23Page 45安捷倫科技高頻元件量測研討會Feb.23, 2006Unknown Thru to the Rescue!Unknown Thru calibration makes 2-port calibrations much easier!No need for matched or ch

24Page 47安捷倫科技高頻元件量測研討會Feb.23, 2006Unknown Thru Calibration RequirementsSystematic errors of all test ports (directivity, source match, reflection tra

25Page 49安捷倫科技高頻元件量測研討會Feb.23, 2006Measuring Physically Long Devices (Usual Way)2-PORT CALIBRATION PLANECABLE MOVEMENT2-PORT CALIBRATION PLANEDUTPage

26Page 51安捷倫科技高頻元件量測研討會Feb.23, 2006Measuring Physically Long Devices (Unknown Thru)2-PORT CALIBRATION PLANESDUT1-PORT CALIBRATION PLANESUnknown thruNo

27Page 53安捷倫科技高頻元件量測研討會Feb.23, 2006Measuring Devices with Non-Aligned Ports(Unknown Thru)DUTUnknown thru1-PORT CALIBRATION PLANES2-PORT CALIBRATION PL

28Page 55安捷倫科技高頻元件量測研討會Feb.23, 2006ORLLMultiport and Non-Aligned Case (Usual Way)3 PORT DEVICELDUTACB2-PORT CALIBRATION PLANECABLE MOVEMENTDUTACBDUTAC

29Page 57安捷倫科技高頻元件量測研討會Feb.23, 2006Multiport and Non-Aligned Case (Unknown Thru)1-PORT CALIBRATION PLANESANY RECIPROCOL 3-PORT THRU 3-PORT DEVICEDUTAC

30Page 59安捷倫科技高頻元件量測研討會Feb.23, 2006Port 1Port 4Port 2Port 3Port 1Port 4Port 2Port 3Unknown thru’sand/orTRL on-wafer calOn-Wafer Calibrations Using Unk

31Page 61安捷倫科技高頻元件量測研討會Feb.23, 2006Long (Aspect Ratio) Device, 3.5 inch x 1 mm cable, Test Comparison-1.4-1.2-1.0-0.8-0.6-0.4-0.20.00.0E+00 2.0E+01 4.

2Page 3安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Why Measure in Pulsed Mode and the DUTs We Test– Wafer Test– Power Amplifiers– Antenna RCS– T/R Modules• Revi

32Page 63安捷倫科技高頻元件量測研討會Feb.23, 2006Known Thru Versus Unknown ThruAny passive device OKCan not use any deviceBad connection not a problemCan not tolera

33Page 65安捷倫科技高頻元件量測研討會Feb.23, 2006Offset Load Calibration OverviewOffset load calibration originated with 8510Offset load is a compound standard – lo

34Page 67安捷倫科技高頻元件量測研討會Feb.23, 2006Offset Load DefinitionOnly available in guided calibration (SmartCal)Math is enhanced over what 8510 didNew FW adde

35Page 69安捷倫科技高頻元件量測研討會Feb.23, 2006Thru Loss Definition8510 did not use loss termPNA includes loss for better accuracy, especially near cutoff and wit

36Page 71安捷倫科技高頻元件量測研討會Feb.23, 2006AgendaOverview of PNA FW Rev. 6.0 Cal RegistersTRL Calibration with 4-port 20 GHz PNA-LUnknown Thru CalibrationOffs

37Page 73安捷倫科技高頻元件量測研討會Feb.23, 2006APE = Automatic Port Extensions• First solution to apply both electrical delay and insertion loss to enhance port e

38Page 75安捷倫科技高頻元件量測研討會Feb.23, 2006Automatic Port Extensions – Step 2• After coaxial calibration, connect an open or short to portion of fixture being

39Page 77安捷倫科技高頻元件量測研討會Feb.23, 2006Automatic Port Extension – ImplementationMeasures Sii(reflection) of each portUses ideal open or short modelsComput

40Page 79安捷倫科技高頻元件量測研討會Feb.23, 2006Which Standards Should I Use?For broadband applications, shorts or opens work equally wellChoose the most convenien

41Page 81安捷倫科技高頻元件量測研討會Feb.23, 2006Narrowband APE Example400 MHz spanLarge variation betweenopen and shortDUT = shortAPE with shortAPE with openAPE wi

3Page 5安捷倫科技高頻元件量測研討會Feb.23, 2006On-Wafer Amplifier Test and Modeling•Most applications are at microwave frequencies•Devices lack adequate heatsinking

42Page 83安捷倫科技高頻元件量測研討會Feb.23, 2006Active Span or Active MarkerNote: when using active marker, selecting or not selecting “adjust for mismatch” makes

43Page 85安捷倫科技高頻元件量測研討會Feb.23, 2006Summary of Automatic Port ExtensionsIdeal for in-fixture applications where complete calibration standards are not

44Page 87安捷倫科技高頻元件量測研討會Feb.23, 2006Fixturing for the MassesFixturing features are same or similar to 4-port PNA-L, ENA, and PLTSPage 88安捷倫科技高頻元件量測研討會F

45Page 89安捷倫科技高頻元件量測研討會Feb.23, 2006Port MatchingPort matching feature is same as embeddingPage 90安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Port Matching

46Page 91安捷倫科技高頻元件量測研討會Feb.23, 2006Port Z (Impedance) ConversionZsPage 92安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Port Z (Impedance) ConversionZsZsZs

47Page 93安捷倫科技高頻元件量測研討會Feb.23, 20062-Port De-EmbeddingIn all cases, the assumption is:• Port 1 of the fixture is connected to the PNA• Port 2 of the f

48Page 95安捷倫科技高頻元件量測研討會Feb.23, 2006Two Versus Four Port Embedding / De-EmbeddingQuestion: On a balanced port, what is the difference between:• Two .s

49Page 97安捷倫科技高頻元件量測研討會Feb.23, 2006On-wafer SMC MeasurementsPrevious versions of FCA (Option 083) did not allow on-wafer measurements using Scalar Mix

50Page 99安捷倫科技高頻元件量測研討會Feb.23, 2006How Do I Get My Probe De-Embedding Data?Perform an SOLT or TRL cal using wafer probesMeasure thru device and save d

51Page 101安捷倫科技高頻元件量測研討會Feb.23, 2006How Do I Get My Probe De-Embedding Data?Measure thru plus probeDe-embed swappedthru data to obtain probe dataSave

4Page 7安捷倫科技高頻元件量測研討會Feb.23, 2006Pulsed Antenna Test• About 30% of antenna test involves pulsed-RF stimulus• Test individual antennas, complete system

52Page 103安捷倫科技高頻元件量測研討會Feb.23, 2006How Do I Get My Fixture De-Embedding Data?Perform an unknown thru cal using coax on one side, a probe on the other

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1安捷倫高頻元件量測研討會2/23/2006Page 1Packaging Development Trend of Integrated Analysis Sung-Mao Wu安捷倫科技高頻元件量測研討會2/23/2006Page 2OutlineDevelopment Trend for PK

5Page 9安捷倫科技高頻元件量測研討會Feb.23, 2006Radar and Electronic-Warfare•Biggest market for pulsed-RF testing•Traditional applications ≤ 20 GHz•Many now include

6Page 11安捷倫科技高頻元件量測研討會Feb.23, 2006VNA Pulsed-RF MeasurementsAverage PulseMagnitude and phase data averaged over duration of pulsePoint-in-PulseData ac

7Page 13安捷倫科技高頻元件量測研討會Feb.23, 2006Pulse-to-Pulse (Single Shot) Measurements• Carrier remains fixed in frequency• Measurement point in pulse remains fi

8Page 15安捷倫科技高頻元件量測研討會Feb.23, 200610 MHz RefTypical Hardware Setup For Wideband DetectionPoint-in-Pulse and Pulse-to-PulseOutput 1 Src OutRef InCplr T

9Page 17安捷倫科技高頻元件量測研討會Feb.23, 2006Minimum Pulse Widths for Point-in-Pulse Measurements Using Wideband DetectionNo2 us600 kHzPNA-L models(2-port, 6, 13

10Page 19安捷倫科技高頻元件量測研討會Feb.23, 2006Pulsed S-parameter Measurement ModesNarrowband/asynchronous acquisition• Extract central spectral component only; m

11Page 21安捷倫科技高頻元件量測研討會Feb.23, 2006Typical Hardware Setup(Narrowband)Output 110 MHz RefSrc OutRef InCplr ThruDUTOutput 2Pulse 2 drive to PULSE IN B (f

12Page 23安捷倫科技高頻元件量測研討會Feb.23, 200685108AFirst True pulsed Network AnalyserStill the most widely used system for TR Module R&D and manufacturing t

13Page 25安捷倫科技高頻元件量測研討會Feb.23, 2006Comparing the 8510 and PNA8510 (85108A)• Dominant mode is wideband detection• Detection is done BEFORE analog-to-di

14Page 27安捷倫科技高頻元件量測研討會Feb.23, 2006Agilent TR Module Test SystemscontinuedCTS-I FamilyCTS-II FamilyPage 28安捷倫科技高頻元件量測研討會Feb.23, 2006Pulse SummaryAver

2安捷倫科技高頻元件量測研討會2/23/2006Page 3Bio tech / New form chipIC/module/System DesignHigh speed/high frequencyHigh thermal / Stress solutionFab/fablessCopper

15Page 29安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Why Measure in Pulsed Mode and the DUTs We Test– Wafer Test– Power Amplifiers– Antenna RCS– T/R Modules• Re

16Page 31安捷倫科技高頻元件量測研討會Feb.23, 2006PNA Pulsed-RF Configuration Example 1• User-supplied external modulator• Average pulse measurementsTTL10MHz RefCplr

17Page 33安捷倫科技高頻元件量測研討會Feb.23, 2006PNA Pulsed-RF Configuration Example 3:Full Forward/Reverse S-Parameter ConfigurationThree output channels drive int

18Page 35安捷倫科技高頻元件量測研討會Feb.23, 2006Z5623A H83 – H84 Test Set Control MacroPage 36安捷倫科技高頻元件量測研討會Feb.23, 2006Z5623A H83 RF Modulator 1-20 GHz123410/20

19Page 37安捷倫科技高頻元件量測研討會Feb.23, 2006PNA Pulsed-RF Configuration Example 4 Pulse1 out10 MHz RefSrc Out• Modulator test set, external receiver gate • Poi

20Page 39安捷倫科技高頻元件量測研討會Feb.23, 2006PNA Pulsed-RF Configuration Example 6Cplr ThruSrc OutRF outRF in• Customer-supplied pulsed bias and pulsed RF, inte

21Page 41安捷倫科技高頻元件量測研討會Feb.23, 2006Resources•www.agilent.com/find/pulsedrf安捷倫科技高頻元件量測研討會Feb.23, 2006Page 42Multiport - PNA based solutions

22Page 43安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Target Applications• PNA Multiport Test Solutions• Specials vs. Standard product• Customer data required fo

23Page 45安捷倫科技高頻元件量測研討會Feb.23, 2006Cellular FEM #1 (Dual band, 1xEV,GPS)Diversity RxPage 46安捷倫科技高頻元件量測研討會Feb.23, 2006Cellular FEM #2 (Quad band, UMTS,

24Page 47安捷倫科技高頻元件量測研討會Feb.23, 2006WLAN FEM（2.4G・５G dual band）2.4 GHz Rx5 GHz Rx2.4 GHz Tx5 GHz TxDiversity SWDiplexerPABPFLNA2.4 GHz / 5 GHz WLAN FEM

3安捷倫科技高頻元件量測研討會2/23/2006Page 5Why SIP ?Single Chip Solution SoC ICBuild-up SubstrateSub-System ModuleBoard Assembly Passives Micro-component Memory IC

25Page 49安捷倫科技高頻元件量測研討會Feb.23, 2006Key Measurement RequirementsCellular FEM without PA• IL, RL for each path up 12.75GHz•Isolation– Frequency > 3x

26Page 51安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Target Applications • PNA Multiport Test Solutions• Specials vs. Standard product• Customer data required f

27Page 53安捷倫科技高頻元件量測研討會Feb.23, 2006PNA/PNA-L Option 550• New firmware option 550 for the PNA/PNA-L adds full 4-port capability and differential measur

28Page 55安捷倫科技高頻元件量測研討會Feb.23, 2006Test Sets OverviewPlatformDescription Benefits87050A-Hxx/Kxx Switching test sets. Lower costNo coupler inside test

29Page 57安捷倫科技高頻元件量測研討會Feb.23, 2006Agilent PNA > 4-port Products offeringFreq. Coverage: PNA Based Unit & Ext. Test set Total Test Ports300 KHz

30Page 59安捷倫科技高頻元件量測研討會Feb.23, 2006Multiport Specials – Variety• Hybrid Test Sets– Hybrid test sets are a combination of the switching and extension t

31Page 61安捷倫科技高頻元件量測研討會Feb.23, 2006Multiport Specials – Variety•SCMM– Single connection multiple measurement test sets allow the user to make differen

32Page 63安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Target Applications • PNA Multiport Test Solutions• Specials vs. Standard product• Customer data required f

33Page 65安捷倫科技高頻元件量測研討會Feb.23, 2006Multiport Specials –Specials vs. Standard productMultiport Special –Custom– Does not follow the NPI PLC process– Fa

34Page 67安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Target Applications • PNA Multiport Test Solutions• Specials vs. Standard product• Customer data required f

4安捷倫科技高頻元件量測研討會2/23/2006Page 7PoP and PiPAvailable 2006 2007Package/ Die CountPackage ThicknessPackage StructurePackage/ Die Coun

35Page 69安捷倫科技高頻元件量測研討會Feb.23, 2006Agenda• Target Applications • PNA Multiport Test Solutions• Specials vs. Standard product• Customer data required f

36Page 71安捷倫科技高頻元件量測研討會Feb.23, 2006Summary• PNA multiport test solutions provide: – Direct test set control made easy with PNA Firmware Rev 6.0s – Fle

37Page 73安捷倫科技高頻元件量測研討會Feb.23, 2006OverviewBackplanesMeasurement set upSingle-ended Differential Frequency & time domainEye diagramsModel extracti

38Page 75安捷倫科技高頻元件量測研討會Feb.23, 2006Important Physical Layer Properties of Differential ChannelsDifferential impedance profile (diff return loss)Transm

39Page 77安捷倫科技高頻元件量測研討會Feb.23, 2006Differential VNA/TDR Applied to All Passive, Linear Components and Interconnectsz When an external precision signal

40Page 79安捷倫科技高頻元件量測研討會Feb.23, 2006Complete Characterization System SolutionDUT + microprobesGigaTest Probe StationPhysical Layer Test System: VNA + P

41Page 81安捷倫科技高頻元件量測研討會Feb.23, 20064 Port Differential VNA Techniques Applied to Tyco Electronics HM-Zd Legacy Backplane System16 inches, 30 inches ba

42Page 83安捷倫科技高頻元件量測研討會Feb.23, 2006DUTIncident waveReflected waveTransmitted waveS11S21Incident waveReflected waveTransmitted waveTDRTDTttDUTTDR and V

43Page 85安捷倫科技高頻元件量測研討會Feb.23, 2006Single-ended Return Loss and Insertion Loss: 26 inch channel length2 GHz/div0 dBInput Single-ended Return Loss S112

44Page 87安捷倫科技高頻元件量測研討會Feb.23, 2006Bandwidth Limit of SMA vs. MicroprobesMeasured with SMA connectorMeasured with microprobeConclusions:1. Microprobes

5安捷倫科技高頻元件量測研討會2/23/2006Page 9Focus Packages - Bumping, WLCSP, FCBGA, SIP, SCSP and modified LF packageSmall & Light -Thin ThicknessThin Thic

45Page 89安捷倫科技高頻元件量測研討會Feb.23, 2006Microprobing vs. SMA Connectors• Probe station required• Probes can be damaged• Can use on any signal lines• No con

46Page 91安捷倫科技高頻元件量測研討會Feb.23, 20064 Port Balanced Measurements:Frequency and Time DomainPort 2Port 1Port 2Port 1Common SignalDifferential SignalStimu

47Page 93安捷倫科技高頻元件量測研討會Feb.23, 200622CC21CC22CD21CD12CC11CC12CD11CD22DC21DC22DD21DD12DC11DC12DD11DDSSSSSSSSSSSSSSSSPort 2Port 1Port 2Port 1Common Sign

48Page 95安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Return Loss & Reflection CoefficientConclusions-Connectors create large impedance discontinuity-Da

49Page 97安捷倫科技高頻元件量測研討會Feb.23, 2006Important Design FeedbackDesigning for 50 Ohm single ended line is not the same as a 100 Ohm differential line.Char

50Page 99安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Transmitted Signal SDD21Conclusions:• Measurement system bandwidth > 40 GHz• 26 inch traces have a

51Page 101安捷倫科技高頻元件量測研討會Feb.23, 2006Eye Diagrams: 26 inch Channel 1 Gbps, 200 psec/div 2.5 Gbps, 80 psec/div5 Gbps, 40 psec/div 7.5 Gbps, 27 psec/divP

52Page 103安捷倫科技高頻元件量測研討會Feb.23, 2006Differential Signal Input Æ Common Signal Output~7% of differential signal amplitude converted to common signalMay

53Page 105安捷倫科技高頻元件量測研討會Feb.23, 2006Measurement and Model ExtractionAGILENT TECHNOLOGIESPNA SERIESVECTOR NETWORK ANALYZERSTIME DOMAIN SIMULATORS(HSPIC

54Page 107安捷倫科技高頻元件量測研討會Feb.23, 2006ConclusionsDifferential pairs will proliferateDifferential characterization requires • microprobes • probe station

6安捷倫科技高頻元件量測研討會2/23/2006Page 11Challenges to PKG Integrated DesignAnalysis ChallengesÆMulti-port parameters analysis and broadband calibration skillÆD

55Page 109安捷倫科技高頻元件量測研討會Feb.23, 2006Keep up to date on:Services and Support Information Events and Announcement- Firmware updates - New product announ

1安捷倫科技高頻元件量測研討會Feb.23, 2006Page 1Enhanced TDR Channel Characterization Capabilities Agilent Technologies Ltd.Brian ChiSenior Project ManagerAgilent Te

2Page 3安捷倫科技高頻元件量測研討會Feb.23, 2006ERPROBE0ΩE/20EWhat do you expect to see at the probe before, during, and after you close the switch?TimeShort Termina

3Page 5安捷倫科技高頻元件量測研討會Feb.23, 2006E/20EERPROBERWhat do you expect to see at the probe before, during, and after you close the switch?TimePerfect Termin

4Page 7安捷倫科技高頻元件量測研討會Feb.23, 2006ERPROBE?ZL = ?Z0 = 50 ΩVi = 200 mVVr = 66.6 mV200 mVolts0 Volts200 mV66.6 mVViVr(ΔV)What is the value of ΖL?TimeMisma

5Page 9安捷倫科技高頻元件量測研討會Feb.23, 2006Distance FormulaWhereνp= velocity of propagationT = transit time from monitoring point to the mismatch and back2TDp⋅=

6Page 11安捷倫科技高頻元件量測研討會Feb.23, 2006The shape of the reflected wave reveals the nature and magnitude of the mismatchWhat is the nature of each of the lo

7Page 13安捷倫科技高頻元件量測研討會Feb.23, 2006The shape of the reflected wave reveals the nature and magnitude of the reflectionComplex load impedances are also i

8Page 15安捷倫科技高頻元件量測研討會Feb.23, 2006Analyzing Reflections of Complex LoadsPage 16安捷倫科技高頻元件量測研討會Feb.23, 2006002incident reflectedmeasuredDUTincident refl

9Page 17安捷倫科技高頻元件量測研討會Feb.23, 2006Required Parameters by Standard – S parameters8RapidIOXX1.3USB 2.0XXX8FirewireX4.1DVIXXX4.1HDMIXXN/AEIA-108XXN/AEIA-

7安捷倫科技高頻元件量測研討會2/23/2006Page 13VNAProbe stationSampleLong traceShort traceshort traceDUT: (Microstrip/Strip TL)same cross-section with different lengt

10Page 19安捷倫科技高頻元件量測研討會Feb.23, 2006Introducing 86100C option 202- Corrected Impedance Profile - PeelingPeeling mitigate measurement errors caused by m

11Page 21安捷倫科技高頻元件量測研討會Feb.23, 2006Peeling - Voltage Bounce DiagramΓR = = 1.0ΓS = - 0.2240 mV-48 mV(192 –1.92)mV240 mV201.6 mV383 mVt=0t=2t=4-Γl = - 0

12Page 23安捷倫科技高頻元件量測研討會Feb.23, 2006What is Normalization?• Built-in Firmware• Removes Test Fixture Error• Increases Accuracy• Allows Customer to Simul

13Page 25安捷倫科技高頻元件量測研討會Feb.23, 2006The procedure of TDR NormalizationPage 26安捷倫科技高頻元件量測研討會Feb.23, 2006Effect of TDR Normalization CalibrationReference

14Page 27安捷倫科技高頻元件量測研討會Feb.23, 2006Fixture Error Correction TechniquesMeasurement Goals•Accuracy•Repeatability•High Dynamic range•Complete characteriz

15Page 29安捷倫科技高頻元件量測研討會Feb.23, 2006Comparison of TDR and PNA (Error Correction)RPC@30pS@20pS & PNAPhasePNANorm@20pSNorm@30pSRPCMagnitudeTDRWavefor

16Page 31安捷倫科技高頻元件量測研討會Feb.23, 2006Mismatch Line Device #1 Return Loss S11 (Magnitude dB)-35-30-25-20-15-10-505.00E+07 2.54E+09 5.04E+09 7.53E+09 1.00

17Page 33安捷倫科技高頻元件量測研討會Feb.23, 2006Diff. TDR ProbeUsed for handheld Differential meas. 2 x Diff. and 2 x Single Ended Probes2 SMA cables2 SMA-m pr

18Page 35安捷倫科技高頻元件量測研討會Feb.23, 2006On Wafer & Packages measuring examplePage 36安捷倫科技高頻元件量測研討會Feb.23, 2006Interconnects – Using Excess L/C

19Page 37安捷倫科技高頻元件量測研討會Feb.23, 2006How close can two reflection sites be and still be seen as independent events?The TDR edge needs time to reach its

8安捷倫科技高頻元件量測研討會2/23/2006Page 15Analysis Case II : ÆImpedance Control Verify by TDR/TDR SystemDesign Condition:Substrate Type : 2 LayerImpedance Contro

20Page 39安捷倫科技高頻元件量測研討會Feb.23, 2006High resolution allows your customers to see what they could never see beforeAt 9 ps step speed, we see 5 separate

21Page 41安捷倫科技高頻元件量測研討會Feb.23, 2006Optimizing MeasurementsYou will lose your edge speed if you have:• Excess or poor quality cabling to and from the D

22Page 43安捷倫科技高頻元件量測研討會Feb.23, 2006Physical Layer Test System (PLTS) is the Most Complete for Differential S parameters•Extensive Calibration•Eye diag

1安捷倫科技高頻元件量測研討會Feb.23, 2006Page 1Using ADS for Signal Integrity DesignSignal Integrity and Advanced Design System Agilent Technologies Ltd.Ming Chih,

2安捷倫科技高頻元件量測研討會Feb.23, 2006Page 3Using ADS for Signal Integrity DesignUnified Environment for SI DesignPage 4安捷倫科技高頻元件量測研討會Feb.23, 2006Signal Integrit

3Page 5安捷倫科技高頻元件量測研討會Feb.23, 2006Signal Integrity (SI)- What is it?It is the application of engineering principles to:Control impedance and reflection

4Page 7安捷倫科技高頻元件量測研討會Feb.23, 2006Computer Interconnect StandardsXAUIOn ChipPCI 32/33 & 64/66Chip-to-Chip Local Bus SystemBackplaneCoreConnect SCSI

5Page 9安捷倫科技高頻元件量測研討會Feb.23, 2006Agilent’s Signal Integrity SolutionsPage 10安捷倫科技高頻元件量測研討會Feb.23, 2006CapabilitiesCapabilitiesHigh Speed High Speed In

6Page 11安捷倫科技高頻元件量測研討會Feb.23, 2006YEARTECHNOLOGYYield OptimizationMicrowave System SimulationHarmonic Balance Simulator198019902000Discrete-valued Opt

7Page 13安捷倫科技高頻元件量測研討會Feb.23, 20064-port Measurement of ConnectorPage 14安捷倫科技高頻元件量測研討會Feb.23, 2006Simulated Step-response of Measured Connectordiffere