Agilent Technologies E8267C PSG Bedienungsanleitung Seite 4

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How is IMD Characterized?
Overview
IMD is measured by examining the output of a device under test (DUT) with a spectrum
analyzer while the DUT is being stimulated with a multitone test signal, Figure 2. For
example, two-tone intermodulation distortion is a common measurement performed
when characterizing the nonlinear behavior of an amplifier. Two discrete tones with
equal power, that fall within the passband of the DUT, are applied to the input of the
DUT. The resultant harmonic and intermodulation distortion products are then measured
using a spectrum analyzer. A spectrum analyzer with wide dynamic range is desirable to
measure low-level distortion products, like 5th and 7th order IMD and harmonics.
1
Based
on these measurements, figures of merit like third order intercept point (TOI) can be
determined.
Figure 2. Traditional setup to measure IMD products using a two-tone test stimulus.
As the bandwidths of devices and systems increase, multitone signals are commonly used
to characterize nonlinear distortion. Placing multiple tones across the bandwidth of the
DUT enables more efficient characterization of the passband and also stresses the DUT
with a higher crest factor signal.
Dependence on phase relationships
IMD measured at a specific frequency varies widely depending on the phase relationships
of the tones that comprise the test signal. You might expect this when you consider that
the phase distribution of the tones determines how they add up at each point in time,
Figure 3. The time domain profile of the composite signal has a different peak to average
ratio depending on whether the individual tones add constructively or destructively.
1. The Agilent PSA Performance Spectrum
Analyzer Series was used for all measure-
ments made in this document. The PSA was
chosen because it provides a leading edge
combination of dynamic range, speed and
accuracy. For more information on the PSA
series of spectrum analyzers, including how
to optimize the PSA distortion measurement
capability, refer to the related literature
section at the end of this document.
f
1
f
2
DUT Spectrum analyzer
Σ
Signal generator #1
Signal generator #2
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