Agilent Technologies B1542A Bedienungsanleitung PDF herunterladen (Seite 13)

New capabilities dramatically

improve measurement times

The HV-SPGU has several new

features that reduce the time

needed to perform a series of

Write/Erase cycles by a factor

of fifteen or more over that of

previous generation solutions.

These improvements include

built-in output tri-state capabil-

ity, shorter pulse periods, and

three-level pulse generation

capability. You can also use the

B1500A with the optional 16440A

The 16445A SMU/PGU Selector Connection

Adapter and the 16440A SMU/Pulse Generator

Selector can be used with the B1500A to switch

effortlessly between the HV-SPGUs and SMUs.

Ultra-fast Write/Erase endurance testing

Write Vth

Erase Vth

NAND Flash NOR Flash

Test Time Test Time

4155/4156 with 41501B 5 days 4 days

B1500A with one HV-SPGU 1.7 hours 24 hours

B1500A with two HV-SPGUs NA 6 hours

A one-million cycle Write/Erase endurance test can

be performed >15x or faster on the B1500A, which

means test time is reduced from days to hours.

and 16445A to switch between

the SMUs and HV-SPGUs on up to

four channels, eliminating the

need for an external switching

matrix. Additional switching

channels can be added by using

the ASU in combination with an

HRSMU. The net result is a fast,

compact, and cost-effective

laboratory solution for NVM cell

endurance testing.

You can display multiple windows

and monitor the progress of your

Write/Erase endurance test in real time.

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