Agilent Technologies 8133A Spezifikationen

Agilent Technologies 16760A Logic AnalyzerService GuidePublication number 16760-97013May 2004For Safety and Regulatory information see the pages at th

10 Chapter 1: General InformationAccessories One or more of the following accessories, not supplied, are required to operate the 16760A logic analyz

102 Chapter 5: TroubleshootingThe troubleshooting consists of flowcharts, self-test instructions, a cable test, and a test for the auxiliary power s

103Chapter 5: TroubleshootingTroubleshooting Flowchart 1

104 Chapter 5: TroubleshootingTroubleshooting Flowchart 2

105Chapter 5: TroubleshootingTo run the self-testsSelf-tests identify the correct operation of major, functional subsystems of the module. You can r

106 Chapter 5: TroubleshootingSelf-Test DescriptionsThe self-tests for the logic analyzer identify the correct operation of major functional areas i

107Chapter 5: Troubleshootingregisters of the backplane interface device and the memory control device can be written to then read. Both a walking “

108 Chapter 5: TroubleshootingMemory DMA Unload Test. The Memory DMA Unload Test performs the same functions as the Memory Unload Test, except DMA b

109Chapter 5: TroubleshootingPassing the System Clocks (Master/Slave/Psync) Test implies that the acquisition ICs of each expander board of a multi-

110 Chapter 5: Troubleshootingmaster board can arm the module, and that all acquisition ICs can recognize the arm signal.EEPROM Test. The EEPROM Tes

111Chapter 5: TroubleshootingData Path Pass-Thru Test. The Data Path Pass-Thru Test ensures that incoming data can flow correctly between the compar

11Chapter 1: General InformationSpecificationsThe specifications are the performance standards against which the product is tested.Setup/Hold Window

112 Chapter 5: Troubleshootingacquisition ICs can reliably capture the incoming data.To exit the test system1 Select Close to close any module or sy

113Chapter 5: TroubleshootingTo test the cables using an Agilent E5378A Single-ended ProbeThis test allows you to functionally verify the logic anal

114 Chapter 5: Troubleshootingshould illuminate showing that the stimulus board is active2 Set up the stimulus board.a Configure the oscillator sele

115Chapter 5: TroubleshootingSetup and Trigger. A Setup and Trigger window appears.c In the logic analysis system window, select the module icon, th

116 Chapter 5: Troubleshootinge Select the Count field, then select Off.6 Configure the Format taba In the logic analyzer Setup and Trigger window,

117Chapter 5: Troubleshootinge Under the Format tab, select the field showing the channel assignments for one of the pods being tested, then select

118 Chapter 5: Troubleshootingd In the Pod threshold window, select User Defined, then select the threshold voltage field. Enter 1.00V.e Select Clos

119Chapter 5: Troubleshooting8 On the logic analyzer, select Run. The listing should look similar to the figure below.Scroll down at least 256 state

120 Chapter 5: Troubleshootingb On the logic analyzer, select Run. Note the lower two bytes now displays two decrementing counters, the upper two by

121Chapter 5: TroubleshootingTo test the cables using an Agilent E5379A Differential ProbeThis test allows you to functionally verify the logic anal

12 Chapter 1: General InformationCharacteristicsThe characteristics are not specifications, but are included as additional information.Environmental

122 Chapter 5: Troubleshooting2 Set up the stimulus boarda Configure the oscillator select switch S1 according to the following settings:•S1 Off•S2

123Chapter 5: Troubleshootingc Select the clock edge field for J-clock, then select Rising Edge.5 Configure the Trigger settingsa In the logic analy

124 Chapter 5: Troubleshooting6 Configure the Format taba In the logic analyzer Setup and Trigger window, select the Format tab.b Under the Format t

125Chapter 5: Troubleshooting7 Configure the logic analyzer thresholdsa Under the Format tab, select the CLK Thresh... field. The Clock threshold wi

126 Chapter 5: TroubleshootingScroll down at least 256 states to verify the data. Label1 shows two decrementing binary counters. If the listing does

1276Replacing AssembliesThis chapter contains the instructions for removing and replacing the logic analyzer module, the circuit board of the module,

128 Chapter 6: Replacing AssembliesCAUTION: Turn off the instrument before installing, removing, or replacing a module in the instrument.Tools Requi

129Chapter 6: Replacing Assemblies5 Push all other cards into the card cage, but not completely in.This is to get them out of the way for removing a

130 Chapter 6: Replacing AssembliesTo remove the logic analyzer cable1 Remove power from the instrumenta Exit all logic analysis session. In the ses

131Chapter 6: Replacing AssembliesTo install the logic analyzer cable1 Connect the logic analyzer cable to the logic analyzer circuit board.a Insert

13Chapter 1: General InformationRecommended Test EquipmentEquipment RequiredEquipment Critical SpecificationsRecommended Agilent Model/Part UseProbe

132 Chapter 6: Replacing Assembliesb Install the two shorter screws (H4) through the rear of both cable clamps into the rear panel. Do not tighten t

133Chapter 6: Replacing AssembliesTo replace the circuit board1 Remove both logic analyzer cables using the “To remove the logic analyzer cable” pro

134 Chapter 6: Replacing AssembliesTo replace the module1 If the module consists of one card, go to step 2.If the module consists of more than one c

135Chapter 6: Replacing Assemblies5 Position all cards and filler panels so that the endplates overlap.6 Seat the cards and tighten the thumbscrews.

136 Chapter 6: Replacing AssembliesTo return assembliesBefore shipping the module to Agilent Technologies, contact your nearest Agilent Technologies

1377Replaceable PartsThis chapter contains information for identifying and ordering replaceable parts for your module.

138 Chapter 7: Replaceable PartsReplaceable Parts OrderingParts listedTo order a part on the list of replaceable parts, quote the Agilent Technologi

139Chapter 7: Replaceable PartsAgilent Technologies Sales Office for information.See Also “To return assemblies” on page 136.Replaceable Parts ListT

140 Chapter 7: Replaceable PartsReplaceable PartsRef. Des. Agilent Part Number QTY DescriptionExchange Assemblies16760-69516 Exchange Acquisition Bo

141Chapter 7: Replaceable PartsExploded ViewExploded view of the 16760A logic analyzer

14 Chapter 1: General Information

142 Chapter 7: Replaceable PartsE5382A AccessoriesThe following figure shows the accessories supplied with the E5382A Single-ended Flying Lead Probe

1438Theory of OperationThis chapter presents the theory of operation for the logic analyzer module and describes the self-tests.

144 Chapter 8: Theory of OperationThe information in this chapter is to help you understand how the module operates and what the self-tests are test

145Chapter 8: Theory of Operationconnector. The mate to this Samtec connector must be designed into and installed in the system under test. Analysis

146 Chapter 8: Theory of Operationstate clock modes and configuration are also done by the comparators. A digital-to-analog convertor (DAC) provides

147Chapter 8: Theory of OperationCPU Interface. The CPU interface is a programmable logic device that converts the bus signals generated by the micr

148 Chapter 8: Theory of OperationConnectors J9, J10, J500, and J501 form and acquisition IC pattern resource bus.In addition to the master board, i

149Aaccessories, 10acquisition, 106IC, 146memory, 146ADCtest, 110assembliesexchange, 138return, 136Bblock-level theory, 144Ccableinstall, 131remove,

150 IndexSself-test, 105description, 106specifications, 11storage, 16systembackplane clock, 109operating, 10, 102test, 112turn on, 28TtestADC, 110ana

Safety NoticesThis apparatus has been designed and tested in accor-dance with IEC Publication 1010, Safety Requirements for Mea-suring Apparatus, and

152Preparing for UseThis chapter gives you instructions for preparing the logic analyzer module for use.

Notices© Agilent Technologies, Inc. 2001-2004No part of this manual may be reproduced in any form or by any means (including electronic storage and re

16 Chapter 2: Preparing for UsePower RequirementsAll power supplies required for operating the logic analyzer are supplied through the backplane con

17Chapter 2: Preparing for Usemechanical defects. If you find any defects, contact your nearest Agilent Technologies Sales Office. Arrangements for

18 Chapter 2: Preparing for Use4 Starting from the top, pull the cards and filler panels that need to be moved halfway out.CAUTION: All multi-card m

19Chapter 2: Preparing for UseCAUTION: If you pull on the flexible ribbon part of the 2x10 cable, you might damage the cable assembly. Using your th

2 The Agilent 16760A Logic Analyzer—At a GlanceThe Agilent Technologies 16760A is a 1500 Mb/s state, 800 MHz timing logic analyzer module for the Ag

20 Chapter 2: Preparing for UseTo configure a multi-card module1 Plan the configuration. Multicard modules can only be connected as shown in the ill

21Chapter 2: Preparing for Use3 Connect a 2x40 cable to J9 and to J10 of each card in the multicard configuration.4 On the expander cards, disconnec

22 Chapter 2: Preparing for Use5 Begin stacking the cards together according to the drawing under step 1. While stacking, connect the free end of th

23Chapter 2: Preparing for Use6 Feed the free end of the 2x10 cables of the lower expander cards through the access holes to the master card. Plug t

24 Chapter 2: Preparing for Use7 Stack the remaining expander boards on top of the master board. While stacking, connect the free end of the 2x40 ca

25Chapter 2: Preparing for Use8 Feed the free end of the 2x10 cables of the expander cards through the access holes to the master card. Plug the 2x1

26 Chapter 2: Preparing for UseTo install the module1 Slide the cards above the slots for the module about halfway out of the mainframe.2 With the p

27Chapter 2: Preparing for Use5 Seat the cards and tighten the thumbscrews.Starting with the bottom card, firmly seat the cards into the backplane c

28 Chapter 2: Preparing for UseTo turn on the system1 Connect the power cable to the mainframe.2 Turn on the instrument power switch.When you turn o

29Chapter 2: Preparing for UseTo clean the module• With the mainframe turned off and unplugged, use a cloth moistened with a mixture of mild deterge

3The 16760A uses operating system version A.02.20.00 or higher. Agilent Technologies 16700-series mainframes with serial number prefix lower than US

30 Chapter 2: Preparing for Use

313Testing PerformanceThis chapter tells you how to test the performance of the logic analyzer against the specifications.

32 Chapter 3: Testing PerformanceTo ensure the logic analyzer is operating as specified, software tests (self-tests) and manual performance tests ar

33Chapter 3: Testing PerformanceTest Equipment Each procedure lists the recommended test equipment. You can use equipment that satisfies the specifi

34 Chapter 3: Testing PerformanceTo assemble the SMA/Flying Lead test connectorsTo assemble the SMA/Flying Lead test connectorsThe SMA/Flying Lead t

35Chapter 3: Testing PerformanceTo assemble the SMA/Flying Lead test connectorsb Trim about 1.5 mm from the pin strip inner leads and straighten the

36 Chapter 3: Testing PerformanceTo assemble the SMA/Flying Lead test connectors2 Solder the pin strip to the SMA board mount connector:a Solder the

37Chapter 3: Testing PerformanceTo assemble the SMA/Flying Lead test connectors4 Check your work:a Ensure that the following four points have contin

38 Chapter 3: Testing Performance16760A Minimum Data Eye Width and Minimum Clock Interval Performance Test Procedure16760A Minimum Data Eye Width an

39Chapter 3: Testing PerformanceEquipment RequiredEquipment RequiredThe following equipment is required for the performance test procedure.Equipment

4 In This BookThis book is the service guide for the 16760A 1500 Mb/s state, 800 MHz timing logic analyzer module. This service guide has eight chap

40 Chapter 3: Testing PerformancePrepare the logic analysis system for testingPrepare the logic analysis system for testing1 Turn on the logic analy

41Chapter 3: Testing PerformancePrepare the logic analysis system for testingSome system CPU board tests may return a status of Untested because the

42 Chapter 3: Testing PerformanceInitialize the test equipment for minimum data eye width/minimum clock interval testInitialize the test equipment f

43Chapter 3: Testing PerformanceInitialize the test equipment for minimum data eye width/minimum clock interval test3 Set up the oscilloscope.a Set

44 Chapter 3: Testing PerformanceConnect the test equipment for the minimum clock interval/minimum eye width testConnect the test equipment for the

45Chapter 3: Testing PerformanceConnect the test equipment for the minimum clock interval/minimum eye width testNOTE: Be sure to use the black groun

46 Chapter 3: Testing PerformanceSet up the test equipmentSet up the test equipmentNext, verify and adjust the pulse generator’s DC offset, deskew t

47Chapter 3: Testing PerformanceSet up the test equipmentDeskew the oscilloscopeThis procedure neutralizes any skew in the oscilloscope’s waveform d

48 Chapter 3: Testing PerformanceSet up the test equipmenthorizontal center of the graticule line is at 1 volt because the vertical offset was set t

49Chapter 3: Testing PerformanceSet up the test equipmentis ±((0.007% * ∆t) + (full scale/2x memory depth) + 30 ps) ≅ ±30 ps. Add 5 ps for display r

5Contents1 General InformationAccessories 10Mainframe and Operating System 10Specifications 11Characteristics 12Environmental Characteristics 12Reco

50 Chapter 3: Testing PerformanceConfigure the logic analysis systemConfigure the logic analysis system1 Configure the Sampling settings.a In the Ag

51Chapter 3: Testing PerformanceConfigure the logic analysis systeme Select the Count field, then select Off.3 Configure the Format settings.a In th

52 Chapter 3: Testing PerformanceConfigure the logic analysis systemsee the fields for Pod 1. f Select the channel assignment field for the pod bein

53Chapter 3: Testing PerformanceConfigure the logic analysis systema Select the pod threshold field for the pod that you are going to test. The Pod

54 Chapter 3: Testing PerformanceConfigure the logic analysis systemscroll to the left and select “Clk Thresh...”. e In the Clock Thresholds window,

55Chapter 3: Testing PerformanceConfigure the logic analysis systemd Enter “A” in the “Label 1 =” field.Adjust sampling positions using Eye Finder1

56 Chapter 3: Testing PerformanceConfigure the logic analysis systemmove it to the recommended starting position of 0.6 ns. All of the blue bars wil

57Chapter 3: Testing PerformanceConfigure the logic analysis systemanalyzer in the 1500 Mb/s mode.)1 Using the mouse, drag the sample position (blue

58 Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modeTest Pod 1 in 200 Mb/s modeThe steps that follow include pass/fail criteria.Determine PA

59Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modeb In the Listing window, select the Markers tab.c Select the G1: button and the Markers S

6 ContentsConfigure the logic analysis system 51Adjust sampling positions using Eye Finder 56Re-aligning a stray channel 57Test Pod 1 in 200 Mb/s mod

60 Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modeb Select OK to close the error message window. c In the Marker Setup window, select the

61Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modefor marker...”. 1 Let the logic analyzer run repetitive for about 1 minute. If no error m

62 Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modeNOTE: As a point of curiosity, you may want to determine the absolute minimum pulse widt

63Chapter 3: Testing PerformanceTest Pod 1 in 200 Mb/s modeSee page 48 for details. 6 Adjust the sampling positions (run Eye Finder). See page 55.7

64 Chapter 3: Testing PerformanceTest Pod 2 in 200 Mb/s modeTest Pod 2 in 200 Mb/s mode1 Leave the first E5382A Flying Lead Probe Set connected to P

65Chapter 3: Testing PerformanceTest Pod 2 in 200 Mb/s modeand the Trigger Functions subtab.b Select “Find pattern n times” and select the “Replace”

66 Chapter 3: Testing PerformanceTest Pod 1 in the 400 Mb/s modeTest Pod 1 in the 400 Mb/s mode1 Disconnect the Pod 2 E5382A Flying Lead Probe Set’s

67Chapter 3: Testing PerformanceTest Pod 1 in the 400 Mb/s modepod 2 bits. 12 Assign bits 2, 6, 10, and 14 of Pod 1.13 Ensure that the Pod 1 thresho

68 Chapter 3: Testing PerformanceTest Pod 1 in the 400 Mb/s modepage 56.20 In the “Setup and Trigger...” window, Clock Setup area, set the clock mod

69Chapter 3: Testing PerformanceTest Pod 1 in the 400 Mb/s mode24 Perform the procedure “Determine PASS/FAIL (1 of 2 tests)” on page 58.25 Select th

Contents 7Performance Test Record 964 CalibratingCalibration Strategy 1005 TroubleshootingTo use the flowcharts 102To run the self-tests 105Self-Test

70 Chapter 3: Testing PerformanceTest Pod 2 in 400 Mb/s modeTest Pod 2 in 400 Mb/s mode1 Leave the first E5382A Flying Lead Probe Set connected to P

71Chapter 3: Testing PerformanceTest Pod 2 in 400 Mb/s modec Enter “A” in the “Label 1 = “ field.14 Adjust the sampling positions using Eye Finder.

72 Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s modeTest Pod 1 in the 800 Mb/s mode1 Disconnect the Pod 2 E5382A Flying Lead Probe Set’s

73Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s modewidth of the 8133A pulse generator so that the pulse width measured at 1 volt on the

74 Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s modemode. 11 In the “Setup and Trigger...” window, Sampling tab, Clock Setup area, set t

75Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s modedifferent based on your test setup. Bring stray channels into alignment if necessary.

76 Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s modeposition you chose on page 74 should remain open. 24 Perform the procedure “Determin

77Chapter 3: Testing PerformanceTest Pod 1 in the 800 Mb/s mode8 Select the Run Repetitive icon in the Listing window.9 Perform the procedure “Deter

78 Chapter 3: Testing PerformanceTest Pod 2 in 800 Mb/s modeTest Pod 2 in 800 Mb/s mode1 Leave the first E5382A Flying Lead Probe Set connected to P

79Chapter 3: Testing PerformanceTest Pod 2 in 800 Mb/s modec Enter “A” in the “Label 1 = “ field.14 Adjust the sampling positions using Eye Finder.

8

80 Chapter 3: Testing PerformanceTest Pod 1 in the 1250 Mb/s modeTest Pod 1 in the 1250 Mb/s mode1 Disconnect the Pod 2 E5382A Flying Lead Probe Set

81Chapter 3: Testing PerformanceTest Pod 1 in the 1250 Mb/s modetab. In the “State Mode Controls” section, select the “1250 Mb/s / 128M Half Chan” m

82 Chapter 3: Testing PerformanceTest Pod 1 in the 1250 Mb/s modenecessary. See page 56.20 Re-set the pulse generator frequency to 625 MHz plus the

83Chapter 3: Testing PerformanceTest Pod 1 in the 1250 Mb/s mode24 Perform the procedure “Determine PASS/FAIL (1 of 2 tests)” on page 58.25 Select t

84 Chapter 3: Testing PerformanceTest Pod 2 in 1250 Mb/s modeTest Pod 2 in 1250 Mb/s mode1 Leave the first E5382A Flying Lead Probe Set connected to

85Chapter 3: Testing PerformanceTest Pod 2 in 1250 Mb/s modec Enter “A” in the “Label 1 = “ field.14 Adjust the sampling positions using Eye Finder.

86 Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s modeTest Pod 1 in the 1500 Mb/s mode1 Disconnect the Pod 2 E5382A Flying Lead Probe Set

87Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s modeAdjust the measured pulse width to 600 psIn this procedure, you will use the oscillo

88 Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s modebottom of the oscilloscope display. It is displayed as “∆=”.10 In the logic analyze

89Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s modeDetermine and set Eye Finder Position (1500 Mb/s mode)16 Set the pulse generator fre

91General InformationThis chapter lists the accessories, the specifications and characteristics, and the recommended test equipment.

90 Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s modeif necessary. See page 56.24 Perform the procedure “Determine PASS/FAIL (1 of 2 tes

91Chapter 3: Testing PerformanceTest Pod 1 in the 1500 Mb/s mode9 Perform the procedure “Determine PASS/FAIL (2 of 2 tests)” on page 60

92 Chapter 3: Testing PerformanceTest Pod 2 in 1500 Mb/s modeTest Pod 2 in 1500 Mb/s mode1 Leave the first E5382A Flying Lead Probe Set connected to

93Chapter 3: Testing PerformanceTest Pod 2 in 1500 Mb/s modec Enter “A” in the “Label 1 = “ field.14 Adjust the sampling positions using Eye Finder.

94 Chapter 3: Testing PerformanceTo test the multi-card moduleTo test the multi-card moduleThis section applies when cards were received as a multi-

95Chapter 3: Testing PerformancePerformance Test RecordPerformance Test Record Performance Test Record16760A Logic AnalyzerLogic Analyzer Serial No.

96 Chapter 3: Testing PerformancePerformance Test Record

994CalibratingThis chapter gives you instructions for calibrating the logic analyzer.

100 Chapter 4: CalibratingCalibration StrategyThe 16760A logic analyzer does not require an operational accuracy calibration. To test the module aga

1015TroubleshootingThis chapter helps you troubleshoot the module to find defective assemblies.