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10-4
Determining System Measurement Uncertainties
Sources of Measurement Errors
Sources of Random Errors
The random error sources are noise, connector repeatability and interconnecting cable
stability. There are two types of noise in any measurement system: low level noise (noise
floor) and high level noise (trace noise).
Low level noise is the broadband noise floor of the receiver which can be reduced through
averaging or by changing the IF bandwidth.
High level noise or trace noise is due to the noise floor, the phase noise of the LO source
inside the test set, or by reducing the IF bandwidth.
Connector repeatability is the random variation encountered when connecting a pair of RF
connectors. Variations in both reflection and transmission can be observed.
Cable stability is dependent on the cable used and the amount of cable movement between
calibration and measurement.
The listing below shows the abbreviations used for random errors in the error models and
uncertainty equations.
• N
F
= noise floor
• N
T
= trace noise
• C
R1
= port 1 cable reflection stability
• C
TM1
= port 1 cable magnitude transmission stability
• C
TP1
= port 1 cable phase transmission stability
• C
R2
= port 2 cable reflection stability
• C
TM2
= port 2 cable magnitude transmission stability
• C
TP2
= port 2 cable phase transmission stability
• R
R1
= port 1 connector reflection repeatability
• R
T1
= port 1 connector transmission repeatability
• R
R2
= port 2 connector reflection repeatability
• R
T2
= port 2 connector transmission repeatability
- Reference Guide 1
- Certification 2
- Assistance 2
- Safety Notes 2
- How to Use This Guide 3
- Documentation Map 4
- Contents 5
- 1 8753ES 9
- Definitions 10
- Corrected System Performance 11
- Instrument Specifications 18
- Test Port Output 20
- Table 1-11 Test Port Output 21
- Table 1-12 Test Port Output 22
- Table 1-13 Test Port Output 23
- Test Port Input 24
- Table 1-15 Test Port Input 25
- Table 1-16 Test Port Input 26
- Table 1-17 Test Port Input 27
- Table 1-18 Test Port Input 27
- Table 1-19 Test Port Input 28
- Table 1-20 Test Port Input 29
- General Information 30
- Speed Parameters 36
- Total Time 37
- 2 8753ET 41
- Table 2-5 Test Port Output 48
- Table 2-6 Test Port Output 49
- Table 2-7 Test Port Output 50
- Table 2-9 Test Port Input 52
- Table 2-10 Test Port Input 53
- Table 2-11 Test Port Input 54
- Table 2-12 Test Port Input 54
- Table 2-13 Test Port Input 55
- Table 2-14 Test Port Input 56
- Table 2-15 Test Port Input 57
- 3 Front/Rear Panel 69
- Front Panel Features 70
- Front/Rear Panel 71
- Analyzer Display 73
- , the IF frequency is not 75
- Marker Fctn 77
- MEASURE RESTART 79
- 4 Menu Maps 81
- Figure 4-2 Menu Map for Copy 83
- Figure 4-5 Menu Map for Local 86
- Meas (ET Models Only) 88
- Meas (ES Models Only) 89
- Save/Recall 93
- Scale Ref 94
- Pwr. Loss/Sens 95
- Lists Menu 95
- Enhanced 95
- Response Menu 95
- Seq Spec 97
- Func Menu 97
- SEQUENCE X 97
- FREQUENCY : 98
- Menu Maps 100
- 5 Hardkey/Softkey Reference 101
- Key Reference 102
- Guide Terms and Conventions 103
- Analyzer Functions 104
- --------= 167
- Velocity Factor 167
- Hardkey/Softkey Reference 170
- 6 Error Messages 171
- Error Messages 172
- PHASE LOCK LOST 188
- 7 Options and Accessories 203
- Using This Chapter 204
- Analyzer Options Available 205
- Service and Support Options 206
- Accessories Available 207
- Options and Accessories 208
- Test Configuration Accessories 212
- Keyboard Template 214
- Preset State 216
- Table 8-1 Preset Conditions 217
- Table 8-2 Preset Conditions 224
- Memory Allocation 226
- Storing Data to Disk 230
- Conserving Memory 232
- Using Saved Calibration Sets 232
- Clearing Memory 233
- The CITIfile Data Format 237
- CITIfile Examples 239
- CITIfile Keywords 242
- Useful Calculations 245
- Uncertainties 249
- Introduction 250
- Sources of Measurement Errors 251
- Sources of Random Errors 252
- (−60/20) 254
- (0.013/40) 255
- Forward Reflection Uncertainty 256
- Reverse Reflection Uncertainty 258
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