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Inhaltsverzeichnis

Seite 1 - Overcome LTE-A and 802.11ac

Overcome LTE-A and 802.11ac Manufacturing Test Challenges with Agilent’s new EXM Agilent Technologies Webcast February 13, 2014 Presentation: Jim M

Seite 2 - Why this is important

Sequence Analyzer 10 Agilent Restricted

Seite 3 - What you can expect to learn

Accelerate Time to Volume Manufacturing Manufacturing Test Integration Program (MTI) TWO approaches to quickly get up and running in non-signaling cal

Seite 4

Test Routine Optimization Agilent Restricted 12 Minimize test equipment idle time with overlapping test routines. Also known as “No Lazy Test Equipmen

Seite 5 - Test challenges

Agilent Restricted 13 Example: Ping Pong Connect 8 Two-Antenna (1 Tx/Rx, 1 Rx diversity) DUTs Rx Tx Boot Cal Boot Cal Rx Tx DUT 1 DUT 2 Boot Cal N

Seite 6 - LTE-A and 802.11ac provide

Example: Pipeline time Time saved DUT1 RFI|O3 DUT2 RFIO|4 DUT1 Rx is tested while DUT2 Tx is tested, and vice versa Tx-DUT1 Rx-DUT1 Boot/DUT2 Tx-DUT2

Seite 7

Agilent Restricted 15 Example: Multiport Adapter (MPA) Tx Rx DUT 1 DUT 2 DUT 3 DUT 4 DUT 5 DUT 6 DUT 7 DUT 8 Rx Tx Rx Tx Rx Tx Rx Tx Rx Tx Rx Tx Rx Tx

Seite 8 - Test Executive

Agilent Restricted 16 Example: Virtual Ports Each DUT is queued up and ready to test as soon as the resource(s) become available VSA (Tx test) VSG (R

Seite 9 - Fast/Multi

Agilent Restricted 17 Example: Virtual Ports VSA (Tx test) VSG (Rx test) RFIO 1 RFIO 2 RFIO 3 RFIO 4 Switching Coordination & Control Tx Testing R

Seite 10 - Sequence Analyzer

Agilent Restricted 18 Example: Virtual Ports VSA (Tx test) VSG (Rx test) RFIO 1 RFIO 2 RFIO 3 RFIO 4 Switching Coordination & Control Waiting Rx T

Seite 11 - Agilent Restricted

Agilent Restricted 19 Example: Virtual Ports VSA (Tx test) VSG (Rx test) RFIO 1 RFIO 2 RFIO 3 RFIO 4 Switching Coordination & Control Rx Testing T

Seite 12

Why this is important We know you have… • Increasing challenges: as the number and complexity of wireless devices continues to increase while costs c

Seite 13 - Example: Ping Pong

Single Insertion Multi-format Testing Connect 1 Smartphone per TRX, test all formats (1 Tx/Rx &1 Rx for cellular, 1 Tx/Rx for WiCON, 1 Rx for GNSS

Seite 14 - Example: Pipeline

Cellular • LTE-Advanced, LTE FDD/TDD • HSPA+, W-CDMA • 1xEV-DO, cdma2000 • GSM/EDGE/EDGE Evo • TD-SCDMA Wireless connectivity • 802.11a/b/g/n/ac • B

Seite 15 - Tx and Rx testing

Agilent Restricted 22 Demonstration 4 DUTs Tested in parallel with 4-up EXM DUTs connected via USB for control and power Each DUT connected to RFIO1

Seite 16 - Example: Virtual Ports

Agilent Restricted 23 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Automation Platform GSM Verification WCDMA Verification Power

Seite 17

Agilent Restricted 24 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Automation Platform GSM Verification WCDMA Verification Power

Seite 18

Agilent Restricted 25 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Automation Platform GSM Verification WCDMA Verification Power

Seite 19

Agilent Restricted 26 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Automation Platform GSM Verification WCDMA Verification Power

Seite 20 - Boot up

Agilent Restricted 27 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Log Window Test results can be sent to a file in .csv format Power

Seite 21 - Broad Multi-Format Coverage

Agilent Restricted 28 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Log Window Test results can be sent to a file in .csv format Power

Seite 22 - Demonstration

Agilent Restricted 29 Demonstration 4 DUTs Tested in parallel with 4-up EXM Test Log Window Test results can be sent to a file in .csv format Power

Seite 23

What you can expect to learn • New techniques for improving test efficiency in today’s testing environment • Challenges of LTE-Advanced Carrier Aggreg

Seite 24

Agilent Restricted 30 Increasing Test Efficiencies Summary The importance of: • Chipset control • Sequencing Test routine optimization: • Ping pong •

Seite 25

Agenda Agilent Restricted 31 Market trends / test challenges Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimiz

Seite 26

Fastest growth is video on mobile Why LTE-Advanced Carrier Aggregation? It’s all about more data, faster! Source: LTE World Summit presentation

Seite 27

Agilent Restricted 33 Why LTE-Advanced Carrier Aggregation? Problem #1 Peak throughput performance of OFDM (LTE) systems is achieve at bandwidths gre

Seite 28

Agilent Restricted 34 Types of LTE Carrier Aggregation Intra-Band CA: • Multiple CCs are used inside of a single frequency Band (3GPP defined bands) •

Seite 29

Agilent Restricted 35 Types of LTE Carrier Aggregation Inter-Band CA: • CCs are in different frequency bands • Allows carriers to combine their spectr

Seite 30 - Increasing Test Efficiencies

LTE-Advanced Carrier Aggregation Test Strategies The carrier aggregation test strategy depends on the chipset test mode capabilities, the test equipm

Seite 31 - Summary

Sequential Carrier Aggregation Test (Inter-band) Advantages: Simplest to implement Does not require a complex test mode to activate all paths in the

Seite 32 - = Around 500,000 Text

Parallel Carrier Aggregation Test (Inter-band) Advantages: No increase in test time for every additional Tx/Rx path tested in the UE Disadvantages:

Seite 33

Sequential LTE Downlink CA Test (Inter-Band) with a Single E6640A TRX Built-in RFIO ports and a single TRX support sequential CA test For testing 2 c

Seite 34

Agenda Market trends / test challenges Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimization Single insertion

Seite 35 - Inter-Band CA:

Parallel LTE Downlink / Uplink CA Test (Inter-Band) With two TRXs, the E6640A can connect two UEs and parallel test one UE that supports two band, int

Seite 36 - Test Strategies

Summary LTE Advanced Carrier Aggregation enables operators to use available spectrum to provide the full throughput and efficiency benefits of wideba

Seite 37 - (Inter-band)

Agenda Agilent Restricted 42 Market trends / test challenges Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimiz

Seite 38

Why IEEE 802.11ac ? • Meet the ever increasing data demands of consumers: - Proliferation of smartphones, tablets, and applications using high definit

Seite 39 - March 27, 2014

What is IEEE 802.11ac ? • Latest, higher data rate WLAN format • Very High Throughput, >1Gbps - With all ‘optional’ features implemented can reach

Seite 40 - (Inter-Band)

802.11ac Test Challenges • New, wider Bandwidth channels - 80MHz - 160MHz (optional) - 80+80 non-contiguous (optional) • Optional new modulation codi

Seite 41

WLAN 802.11ac Test Challenges “Nothing new, just more of the same” • Same tests, BUT wider channel bandwidth, higher data rates - Channel Power - Spe

Seite 42

802.11ac Manufacturing Test Strategies • WLAN manufacturing test is usually performed in ‘non-signaling modes’ - uses Tx & Rx ‘test modes’ for t

Seite 43 - Why IEEE 802.11ac ?

802.11ac Test Challenges Challenge: • New, wider Bandwidth channels - 80MHz - 80+80 non-contiguous (optional) - 160MHz (optional) 48 SOLUTION: • N

Seite 44 - What is IEEE 802.11ac ?

802.11ac Test Challenges Challenge: • Optional new modulation coding scheme - 256QAM Solution: • Ensure EVM performance sufficient (-42 dB) 49 Ag

Seite 45 - 802.11ac Test Challenges

Multi-format device test • GSM, W-CDMA, cdma2000®, TD-SCDMA, LTE TDD/FDD, LTE-A • Bluetooth®, WLAN, GNSS (GPS) • MIMO, Carrier Aggregation High-perfor

Seite 46 - • MIMO testing, if required

802.11ac Test Challenges Challenge: • Optional extended MIMO modes - More spatial streams and antennas: up to 8 - Multi-user MIMO on downlink: up to

Seite 47

WLAN MIMO Test in Manufacturing True MIMO testing • Multiple TRX’s for simultaneous test of all MIMO channels • Provides full and complete set of MIM

Seite 48

WLAN MIMO Test in Manufacturing Switched MIMO • Sharing analyzer by fast switching to measure each MIMO channel in turn - With any STBC and scrambling

Seite 49

WLAN MIMO Test in Manufacturing Composite MIMO • Calculating some MIMO metrics from a ‘combined channel’ capture of a specially coded set of waveforms

Seite 50

Agilent Restricted 54 Demonstration 2 WLAN 802.11ac True MIMO Measurements with EXM

Seite 51 - True MIMO testing

WLAN 802.11ac True MIMO Receiver Test Agilent Restricted 55 Start two source and set up synchronization Note: This is example uses the V9077B Softwar

Seite 52 - Measurements

WLAN 802.11ac True MIMO Receiver Test Agilent Restricted 56 Start two source and set up synchronization Note: This is example uses the V9077B Softwar

Seite 53 - Composite MIMO

WLAN 802.11ac True MIMO Receiver Test Agilent Restricted 57 Start two source and set up synchronization Note: This is example uses the V9077B Softwar

Seite 54 - Demonstration 2

WLAN 802.11ac True MIMO Receiver Test Agilent Restricted 58 Start two source and set up synchronization Note: This is example uses the V9077B Softwar

Seite 55 - Instance 2 control TRX 2

WLAN 802.11ac True MIMO Transmitter Test Agilent Restricted 59 Configure the measurement application for transmitter modulation analysis Note: This i

Seite 56

6 LTE-A and 802.11ac provide new test challenges Reducing test cost and increasing test speed have been on-going challenges. New technologies provide

Seite 57

WLAN 802.11ac True MIMO Transmitter Test Agilent Restricted 60 Configure the measurement application for transmitter modulation analysis Note: This i

Seite 58

Summary 802.11ac offers the capability of higher data throughput WiFi connectivity, using the same 5GHz unlicensed spectrum The higher bandwidth chan

Seite 59

Agenda Agilent Restricted 62 Market trends / test challenges Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimiz

Seite 60

Summary Agilent Restricted 63 We talked about… Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimization such as

Seite 61

E6640A EXM Wireless Test Set Solve today, evolve tomorrow Ramp up rapidly & optimize full volume production 64 Agilent Restricted

Seite 62

Agilent Restricted Solve Today, Evolve Tomorrow Ramp up rapidly & optimize full-volume manufacturing Ultimate Scalability & Port Density

Seite 63

Ultimate Scalability & Port Density Optimize your multi-device manufacturing test Scale your production line • Up to 4 independent TRX • Each is

Seite 64 - E6640A EXM Wireless Test Set

Broad Multi-Format Coverage 67 LTE 802.11ac MIMO Simplify Signal Creation Signal Studio Fast Measurements Sequence Analyzer Superior Software Applica

Seite 65 - Solve Today, Evolve Tomorrow

For More Information Agilent EXM Wireless Test Set: • www.agilent.com/find/exm • www.youtube.com search: Agilent EXM Contact your local Agilent Sales

Seite 66 - EXM’s TRX

Agenda Agilent Restricted 7 Market trends / test challenges Techniques to improve test efficiencies Fast sequenced non-signaling Test routine optimiza

Seite 67

A Quick Reminder: non-signaling test Agilent Restricted 8 Test Executive Test Executive Signaling Tester Non-Signaling Tester Chipset control, read re

Seite 68 - For More Information

Progression to Faster non-signaling test Agilent Restricted 9 Basic Non-signaling Sync/ Sequence Fast/Multi-sequence Basic RF stimulus/ measure Sequen

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