Figure 3. Access up to 128 internal signals for each debug pin. Select cores with 1, 2, 4,
8, 16, 32, or 64 signal banks. Signal banks all have identical width (4 to 128 signals
wide) determined by the number of pins you devote for debug. Each pin provides
sequential access to 1 signal on every input bank. Using an optional 2X time division
compression in state mode, each pin can access 2 signals per bank.
Figure 2. Create a timesaving FPGA measurement system. Insert an ATC2 (Agilent Trace
Core) core into your FPGA design. With the application running on your logic analyzer
you control which group of internal signals to measure via JTAG.
Figure 1. The FPGA dynamic
probe application endows your
logic analyzer with unique
productivity enhancements to
find problems more quickly.
Debug your FPGAs faster and more
effectively with a logic analyzer
The Agilent FPGA dynamic probe,
used in conjunction with an
Agilent logic analyzer, provides
the most effective solution for
debugging problems [simple
through complex]. The FPGA
dynamic probe lets you:
• View internal activity —
With a logic analyzer, you are
normally limited to measuring
signals at the periphery of the
FPGA. With the FPGA dynamic
probe, you can now access
signals internal to the FPGA.
You can measure up to 128
internal signals for each
external pin dedicated to
debug, unlocking visibility into
your design than you never
had before.
• Make multiple measurements
in seconds — Moving probe
points internal to an FPGA
used to be time consuming.
Now, in less than a second you
can easily measure a different
set of internal signals —
without design changes. FPGA
timing stays constant when
you select new sets of internal
signals for probing.
• Leverage the work you did in
your design environment —
The FPGA dynamic probe is
the industry’s first tool that
maps internal signal names
from your FPGA design tool
to your logic analyzer.
Eliminate unintentional
mistakes and save hours of
time with this automatic
setup of signal and bus
names on your logic analyzer.
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