6
Conclusion
With the new enhanced P-Series
power meter fi rmware with
external triggering in CW mode,
the measurement test time can be
shortened signifi cantly.
For the frequency sweep mode,
a signifi cant 50-percent test time
reduction can be reached compared to
the convention “send command-and-
measure” method with a comparable
measurement accuracy.
Refer to Table 3.
For the power sweep mode, the
measurement test time is shortened
by a signifi cant 20-percent compared
to the conventional method.
Refer to Table 4.
You can see that there is a compelling
speed improvement especially when
there are multiple instruments in
a system controlled by a single
controller. Why does this happen?
The reason is that the measurement
commands are sent only at the
beginning of the measurement.
Subsequently, the power meter will
automatically perform the actual
measurements and acquisitions.
Therefore, the controller is freed
up so that it can execute other
measurements simultaneously.
With the new enhanced P-Series
fi rmware version A.04.01, you can now
optimize your power measurements
speed to produce a reliable result and
meet your throughput requirements
without any additional cost involved.
DOWNLOAD the free fi rmware now at
www.agilent.com/fi nd/
pseriesfi rmware.
Table 3. Test time improvement in frequency sweep compared to the external
triggering method and the conventional “send command-and-measure” method
1
.
Start Frequency = 50 MHz
Stop Frequency = 6 GHz
Data taken with E9304A sensor with Trigger Output enabled
Frequency
Sweep
Points
Frequency
Interval
(MHz)
Test time through GPIB in seconds Test Time
Improvement
(%)
Conventional External Triggering
120 50 15.78 7.412 53
596 10 80.02 31.61 61
1191 5 153.8 62.02 60
1984 3 260.8 102.4 61
Table 4. Test time improvement in power sweep compared to the external trig-
gering method and the conventional “send command-and-measure” method”
2
.
Start Power = –40 dm
Stop Power = 20 dBm
Frequency = 1 GHz
Data taken with E9304A sensor with Trigger Output enabled
Power
Sweep
Points
Power
Interval
(dB)
Test time through GPIB in seconds Test Time
Improvement
(%)
Conventional External Triggering
31 2 13.16 11.28 17
61 1 24.99 20.45 22
121 0.5 48.67 39.85 22
301 0.2 120.6 104.1 16
New SCPI commands Added in A.04.01 Firmware
SENSe[1]|2:BUFFer:COUNt <numeric_value>
SENSe[1]|2:BUFFer:COUNt?
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STARt <numeric_value>
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STARt?
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STOP <numeric_value>
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STOP?
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STEP <numeric_value>
[SENSe[1]]|2:FREQuency[:CW|FIXed]:STEP?
2. Sample VEE runtime program can be obtained from an Agilent sales and representative.
The measurement speed may varies with the number of sweep points and power level.
(296 Seiten)
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