Agilent Technologies N5416A Wartungshandbuch PDF herunterladen (Seite 215)

Low and Full Speed Tests 7

Notes on USB Electrical Compliance Testing 215

5 Click OK to close the Test Instructions dialog.

Viewing Test Results

1 When the Testing Complete dialog appears, click OK.

The Results tab shows the test results.

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Agilent N5416A 1
USB 2.0 Compliance Test 1
In This Book 4
Contents 5
7 Low and Full Speed Tests 11
8 On-The-Go Electrical Tests 12
Installing the Software 16
Installing the License Key 17
Table 2 Digital Multimeter 21
Setting Up the Equipment 25
Single-Ended Connection 26
Online Help Topics 30
Running Tests 31
Device Hi-Speed Tests 33
3 Device Hi-Speed Tests 34
EL_6 Rise Time 39
EL_6 Fall Time 39
Device Packet Parameters 41
Device Hi-Speed Tests 3 45
Device CHIRP Timing 48
Device Test J/K, SE0_NAK 59
Device Receiver Sensitivity 65
Hub Hi-Speed Tests 71
Before Running These Tests 72
Hub Disconnect Detect 86
IO Libraries>IO Control 99
82357 device 99
4 Hub Hi-Speed Tests 100
Hub Hi-Speed Tests 4 101
Connecting the Equipment 102
Running the Tests 103
Test Instructions 103
Viewing Test Results 105
Equipment Used 106
Selecting the Tests 107
Configuring the Tests 107
Test Instructions, Part 1 114
Test Instructions, Part 2 115
EL_40 Resume Timing Response 123
EL_8 K Test 131
EL_9 SE0_NAK Test 132
Agilent Technologies 141
Host Hi-Speed Signal Quality 143
EL_21 Sync Field Length Test 152
EL_25 EOP Length Test 152
Host Disconnect Detect 155
Host CHIRP Timing 159
Host Suspend/Resume Timing 164
EL_41 Resume Timing Response 167
Host Test J/K, SE0_NAK 169
Low and Full Speed Tests 177
Droop/Drop Test 178
USB Power 179
Host and Self-Powered Hubs 180
Test port indicator 185
Blinking LED indicate 185
Test port 185
Bus-Powered Hubs 188
Fixture) 194
Inrush Current Test 197
Signal Integrity Test 200
Host Full Speed Test 202
Hub Downstream Low Speed Test 205
Upstream Signal Quality Test 211
Upstream Full Speed Test 216
On-The-Go Electrical Tests 227
E3 VBUS Rise Time 232
E19 A-Device Session Valid 232

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